YAMATE PEARL & PIN MFG. CO., LTD.
New Crown - Precision Probe Card Pin Manufacturing Specialist
New Crown - Precision Probe Card Pin Manufacturing Specialist
Highly uniform probe pin manufacturing through batch processing, eliminating incoming inspection and sorting
New Crown's High-Precision Probe Pin Manufacturing Lineup
(For Cantilever / Vertical Type)
Through batch processing, wire diameter variation is minimized to the extreme. High-precision probe pins with excellent linearity and uniformity of the taper section.
(Ultra-High Precision Ultra-Fine Ultra-Short Probe Pin)
Successfully developed ultra-high precision short pins with complete mass production system. Compatible with almost all alloys regardless of processing material.
MEMS Pin Structure: Taper Angle 30-60° ・ Wire Diameter φ20-80μm ・ Total Length 3mm and up Click to enlarge
Ideal for applications requiring high precision and high reliability in semiconductor inspection using MEMS technology.
Processing achievement with advanced materials excellent in electrical properties
High-precision taper processing with high melting point materials
Measurement Equipment: OLYMPUS OSL4100, KEYENCE VK-X250
We provide the optimal tip shape according to your application
Chamfered processing improves tip durability.
Rounded tip shape minimizes damage to target objects.
Precision management technology that surpasses competitors and comprehensive capability to solve customer challenges
By processing large quantities of probe pins in batches, we minimize variation between individual units to the extreme and achieve uniform taper precision. This is our greatest technical strength.
By precisely managing probe pin tip diameter at the micron level, we ensure reliable contact with increasingly miniaturized semiconductor pads.
Scratches generated during the polishing process align in the same direction as the taper, increasing needle strength and dramatically improving durability. This is our unique technology not found in competitors.
With established manufacturing processes and flexible production systems, we support short delivery time probe pin manufacturing.
Specific cost reduction and operational efficiency brought by New Crown's high-precision technology
Due to high-precision products, the incoming inspection process on the customer side can be omitted. Inspection costs and time can be significantly reduced.
Since wire diameter variation is minimized through batch processing of large quantities, diameter-based sorting is unnecessary. Work efficiency is significantly improved, contributing to reduced sorting staff hours.
No out-of-spec products from sorting, simplifying inventory management. Dead stock risk can be minimized.
Short delivery time achieved through established manufacturing processes. Operation with minimum necessary inventory becomes possible, reducing inventory costs.
Reduction effect actually reported by implementing customers. Total cost is significantly reduced through elimination of incoming inspection, sorting operations, and unnecessary inventory.
Cost Reduction Breakdown:
Overwhelming superiority in taper length and tip diameter management precision
Figure: Processing Precision Comparison Between New Crown and Competitors (Based on Actual Measurement Data)
| Management Items | New Crown (Mechanical Polishing) | Competitor A (Chemical Polishing) | Competitor B (Mechanical Polishing) |
|---|---|---|---|
| Taper Length Precision | Within ±5μm | ±30μm 6x error |
±15μm 3x error |
| Tip Diameter Precision | Within ±2μm | ±8μm 4x error |
±5μm 2.5x error |
| Surface Roughness (Ra) | 0.05μm or less | 0.15μm 3x rougher |
0.10μm 2x rougher |
| Roundness | Within ±1μm | ±5μm Elliptical |
±3μm Slightly elliptical |
| 100% Inspection Support | ○ | × Sampling only |
△ Partial only |
Unique automated measurement system achieving high precision and high reproducibility
As a specialist in mechanical polishing, we are well aware that the taper surface has fine irregularities from polishing. Since angle measurement using the surface may lack reproducibility and accuracy, we adopt a method of setting an arbitrary reference point inside the taper and automatically measuring the diameter at fixed intervals from that point. This realizes highly precise and stable measurement.
Starting from reference point φ15μ, measurement points L1-L5 are set at 100μm intervals. d15 length (reference point to tip) and tip diameter are automatically measured.
Automatically measure φ15μm as the reference wire diameter and identify its precise position. This reference point serves as the starting point for all measurements.
Set L1-L5 at positions every 100μm backward from the reference point, and automatically measure the wire diameter at each of these points.
Using the tip as reference, automatically measure the tip diameter.
Automatically measure the distance from the tip to the reference point as "d15 length".
The linearity inside the taper is precisely measured using an analog method. Linearity faithful to design drawings is New Crown's greatest feature.
| Company Name | 有限会社 山手製針所 YAMATE PEARL & PIN MFG. CO., LTD. |
|---|---|
| Founded | December 1950 |
| Representative | President & CEO: Masahiro Yamate |
| Capital | ¥3,000,000 |
| Employees | 12 (As of November 2025) |
| Business |
・Manufacturing of probe pins for semiconductor inspection ・Manufacturing of MEMS probes ・R&D of precision processing technology ・Manufacturing and sales of sewing pins ・Manufacturing and wholesale of 100-yen shop sewing products ・Trade business agency |
| Main Bank | Hiroshima Shinkin Bank, Misasa Branch |
High-precision probe pins for semiconductor industry, achieving quality improvement and cost reduction for customers.
Industry-leading precision control technology, creating new standards for semiconductor inspection globally.
Established in Misasa-cho, Hiroshima City, and started manufacturing sewing pins
Chiyoda-cho, Yamagata-gun, Hiroshima Prefecture (now Kita-Hiroshima City)
Oasa-cho, Yamagata-gun, Hiroshima Prefecture (now Kita-Hiroshima City)
Yoshida-cho, Takata-gun, Hiroshima Prefecture (now Akitakata City)
Entered semiconductor inspection probe pin manufacturing
Business diversification promotion
Established ultra-fine processing technology
Official certification of traditional technology
New factory completed with latest manufacturing equipment. Production capacity doubled.
Achieved dramatic improvement in production efficiency
Introduced automatic measurement system from reference point φ15μ. Achieved high precision with 6.5% variation
Strengthened production system for next-generation products
Established mass production system for ultra-high precision ultra-fine ultra-short probe pins φ30 micron×L4mm~
Established industry-leading ultra-fine processing technology
Achieved both high precision and high efficiency
Equipped with Japan's highest-level inspection equipment, achieving dramatically improved ultra-high precision measurement.
Further evolution of ultra-high precision measurement
With New Crown's high-precision probe pins, 6.5% uniformity eliminates incoming inspection and sorting. We have a proven track record of customers achieving approximately 20% cost reduction.
If your company wants to simultaneously achieve quality improvement and cost reduction in semiconductor inspection, please contact New Crown.
Your inquiry will be sent with the selected subject.
For urgent matters, please contact us by phone: 082-237-3332 (Main)
YAMATE PEARL & PIN MFG. CO., LTD.
High-Precision Probe Card Pin Manufacturing
m_box@yamate-net.co.jp
082-237-3332 (Main)
2-16-10 Omiya, Nishi-ku,
Hiroshima City, 733-0007, Japan
Click on each route to see directions on Google Maps
